Research

Areas:

• Defect and fault testing
• Design automation
• Defect diagnosis
• Design for Testability (DFT)
• Novel test methodologies

Current Projects:

• IDDQ Pass-Fail limit setting
• Computer Aided Defect to Fault Mapping (CADFM)
• Delay testing incorporating capacitive cross talk
• Development of a MAGFET Built-in Current Sensor (BICS)
• Placement and routing of Built-in current sensor